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@prefix np: <http://www.nanopub.org/nschema#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix nt: <https://w3id.org/np/o/ntemplate/> .
@prefix npx: <http://purl.org/nanopub/x/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix orcid: <https://orcid.org/> .
@prefix ns1: <http://purl.org/np/> .
@prefix prov: <http://www.w3.org/ns/prov#> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .

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}

sub:assertion {
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    dct:description "the minimum concentration of a surfactant at which micelle formation occurs.";
    rdfs:label "Critical micelle concentration", "critical micelle concentration of substance";
    rdfs:seeAlso <https://www.sciencedirect.com/topics/chemical-engineering/critical-micelle-concentration#:~:text=Critical%20micelle%20concentration%20(CMC)%20is%20defined%20as%20the%20surfactant%20concentration,other%20molecules%20and%20form%20micelles.>;
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sub:provenance {
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}

sub:pubinfo {
  orcid:0009-0002-2913-1293 foaf:name "Christos Vasileiou" .
  
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